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Facts You Need to Know about Reliability in Testing

Delkin continuously invests in DVT—Design Verification Testing—and ORT—Ongoing Reliability Testing

 

Reliability in testing is an important part of the process when determining the right industrial Flash storage device. Through testing, you can determine the most reliable storage solution for your needs. This process also allows you to identify potential issues within your application that could be interfering with the way the device uses memory. In response to testing, you can make sure your application operates at peak performance levels in the field. Having a testing partner like Delkin—who will get to know your application and perform customized testing that is specific to the way your device will be used—is the best way to find reliable storage, but what actually counts as reliable? Here are the facts you need to know about reliability in testing.

 

Testing matters because NAND flash memory is complex.

Every kind of NAND flash memory has specific characteristics. It is known that SLC NAND flash memory stores one bit of data per cell, which means that it can perform operations quickly and offer the highest degree of data protection possible. It is known that MLC NAND flash stores two bits of data per cell, which comes with a slight degradation in speed and data protection when compared to SLC NAND flash. There are several other design characteristics that are known and understood.

 

What isn’t known is how a specific type of NAND flash memory will perform in a specific application. Device-specific design features and operating conditions all play a role, so understanding the characteristics of a specific type of storage is not enough to determine if it is the right choice for an application. Testing bridges this gap.

 

Reliability in testing depends on creating real-world conditions.

For reliability in testing, it is necessary to simulate the real-world operating conditions of the application in the field. This includes exposing the device to realistic temperature, shock, and vibration levels. However, it isn’t necessary to test the application past its expected limit, as this may make a reliable choice for storage seem insufficient. Reliability in testing also depends on repeating the test a sufficient number of times and looking for different kinds of errors within the testing beyond complete failures.

 

The Customer Applications team at Delkin will work to understand your application’s unique characteristics and to deliver absolute reliability in testing by using real-world operating conditions. Contact us to learn more about our embedded storage testing.

 

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