Delkin continuously invests in DVT—Design Verification Testing—and ORT—Ongoing Reliability Testing

DVT and ORT- Exploring Delkin’s Commitment to Product Testing

Testing is a critical part of creating robust embedded storage devices. It allows problems to be identified and corrected before they ever make their way into an application and cause failures. At Delkin, we’re continually investing in new and better ways to test our products and deliver consistently high-quality industrial storage options. This includes investing in DVT and ORT in-house.

DVT and ORT

Delkin continuously invests in DVT—Design Verification Testing—and ORT—Ongoing Reliability Testing. We do these tests in-house using advanced testing equipment because it lets us deliver shorter turnaround times for our customers and control the quality of every embedded storage device that leaves our US based manufacturing facility and gets shipped to a customer.

DVT is done on new designs as well as any time a slight change occurs with a design, such as changing a product’s CPU or flash die part number—these types of changes create a need for a new product number and change in bill of materials. ORT is performed on designs that have gone through DVT testing and continue to be manufactured by Delkin. ORT ensures that all of our products maintain the same high level of quality and accuracy as our initial design and that there are no changes in consistency that could impact functionality.

HALT

Highly Accelerated Life Tests, or HALT, can now also be performed in-house by Delkin. During HALT, products are exposed to the kinds of extreme environmental conditions that they might be subjected to after they are installed. The temperature is raised and lowered repeatedly and the memory device is exposed to high levels of vibration. The exact conditions used during HALT can be adjusted to meet the customer’s needs.

There are four steps to HALT: thermal step testing, rapid thermal cycling, vibration step testing, and combined environment testing. One computer manages the testing conditions while another runs the host application in which the memory will be used to emulate real operating conditions as closely as possible. These results are analyzed in-house so that any necessary design changes can be made efficiently and effectively.

If you need embedded storage for rugged operating conditions, you can trust Delkin to perform testing to your specific needs and standards. In-house testing means fast turnarounds for shipments and the confidence that problems will be found and fixed before the storage is used in your devices. Contact us for more information about product samples or testing.